Methods: The circuits are developed on m-GDI technology using the Cadence virtuoso tool and a spectre simulator is used to carry out the simulation. Thus, to reduce the testing power, modified gate diffusion input (m-GDI) logic based LFSR in 45nm technology is proposed in this paper. Objective: The pseudorandom patterns generated by the LFSR exhibit low-correlation among the patterns, this increases the switching activity and power dissipation while testing the VLSI circuit. These pseudo-random patterns are used as test vectors for testing the VLSI circuits. Background: A Linear Feedback Shift Register (LFSR) is typically used for generating the test patterns in built-in self-test (BIST) as it produces pseudorandom patterns at every clock cycle.
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